LogicVision Delivers Power-Aware Memory Self-Repair

SAN JOSE, Calif. — May 15th, 2009 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced a new power-aware version of its ETMemory™ built-in self-repair solution. On-chip memory test and repair is now fully compatible with the increasingly popular power management approach of using voltage islands to minimize power during functional operation.

A voltage island is defined as a core or design region that is powered by a separate supply voltage. Each island can then be powered up or down based on operational need resulting in an overall power saving. The on-chip repair process involves reconfiguring defective memories to swap out defective memory elements with spares. The reconfiguration data is stored next to each defective memory on power-up by the self-repair capabilities. LogicVision’s new self-repair solution keeps track of voltage island power activities and ensures that any re-activated defective memory is properly reconfigured. The solution supports any number of voltage islands and has been optimized to reduce the area overhead needed for the self-repair infrastructure as well as the time required to reconfigure defective memories.

“We are seeing a rapid increase in the use of power management techniques throughout our customer base.” said Stephen Pateras, Vice-President of Marketing at LogicVision. “Our new power-aware memory self-repair solution is the result of an on-going effort to ensure our BIST solutions fully support evolving low-power design practices.”

The power-aware memory self-repair capability will be available in June and is an option to LogicVision’s ETMemory product.

About LogicVision Inc.

LogicVision (NASDAQ: LGVN) provides a comprehensive set of proprietary built-in-self-test (BIST) technologies for achieving the highest quality silicon manufacturing test while reducing test costs for complex System-on-Chip devices. LogicVision's Dragonfly Test Platform™ enables integrated circuit designers to embed BIST functionality into a semiconductor design. This functionality is used during semiconductor production test and throughout the useful life of the chip. The complete Dragonfly Test Platform, including the ETCreate™, Silicon Insight™ and Yield Insight™ product families, improves profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time-to-market and time-to-yield.For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.