ARM wrestles with silicon, battery hurdles
Rick Merritt, EETimes
8/19/2011 12:10 AM EDT
PALO ALTO, Calif. – Big hurdles in silicon scaling and battery technology stand in the way of huge opportunities in mobile systems, said an ARM executive in a keynote here.
"Silicon scaling will end at some point, and I think it's coming sooner than many people think," said Simon Segars, general manager of ARM's physical IP division in a keynote at the annual Hot Chips event here. What's more, "we really need a new battery technology," he said.
With silicon atoms measuring a fraction of a nanometer in diameter and process technology approaching single nm digits, "you can only scale so far before we need other materials like III-V semiconductors," he said
|
|
E-mail This Article |
|
Printer-Friendly Page |
|
||||||
Arm Ltd Hot IP
Related News
- Arm Chiplet System Architecture Makes New Strides in Accelerating the Evolution of Silicon
- Arm Total Design Ignites Growing Ecosystem of Arm-based Silicon for a Sustainable AI Datacenter
- HCLTech and Arm Collaborate on Custom Silicon Chips Optimized for AI Workloads
- HCLTech and Arm collaborate on custom silicon chips optimized for AI workloads
- Google Cloud Delivers Customized Silicon Powered by Arm Neoverse for General-Purpose Compute and AI Inference Workloads
Breaking News
- RISC-V International Promotes Andrea Gallo to CEO
- See the 2025 Best Edge AI Processor IP at the Embedded Vision Summit
- Andes Technology Showcases RISC-V AI Leadership at RISC-V Summit Europe 2025
- RISC-V Royalty-Driven Revenue to Exceed License Revenue by 2027
- Keysom Unveils Keysom Core Explorer V1.0
Most Popular
- RISC-V International Promotes Andrea Gallo to CEO
- See the 2025 Best Edge AI Processor IP at the Embedded Vision Summit
- Andes Technology Showcases RISC-V AI Leadership at RISC-V Summit Europe 2025
- Ceva, Inc. Announces First Quarter 2025 Financial Results
- Cadence Unveils Millennium M2000 Supercomputer with NVIDIA Blackwell Systems to Transform AI-Driven Silicon, Systems and Drug Design






